[Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network
- DOI
- 10.1155/2021/6036118
- Published
- 2021-01
- Container
- Computational Intelligence and Neuroscience
- Publisher
- Wiley
- Open access
- unknown
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serious concern Score 29/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1155/2021/6036118,
title = {[Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network},
author = {Jie Wu and Xiaojuan Chen and Zhaohua Zhang},
year = {2021},
journal = {Computational Intelligence and Neuroscience},
doi = {10.1155/2021/6036118},
url = {https://doi.org/10.1155/2021/6036118}
}RIS
TY - JOUR TI - [Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network AU - Jie Wu AU - Xiaojuan Chen AU - Zhaohua Zhang PY - 2021 JO - Computational Intelligence and Neuroscience DO - 10.1155/2021/6036118 UR - https://doi.org/10.1155/2021/6036118 ER -
APA
Wu, J., Chen, X., & Zhang, Z. (2021). [Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network. Computational Intelligence and Neuroscience. https://doi.org/10.1155/2021/6036118
Source records
- crossref · retrieved 2026-09-25T05:50:33.677Z