Synchrotron-Based X-ray Fluorescence Profiling of Asphaltene Deposits: Overcoming Atmospheric and Scattering Interferences for Enhanced Elemental Characterization

Mohammad Rezaei-Pandari, Mohammad Ali Haddad, Roghaye Izan, Amir Sayid Hassan Rozatian, Messaoud Harfouche, Latif Ullah Khan

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DOI: 10.1177/00037028261474595
Published: 2026-09-23
Container: Applied Spectroscopy
Publisher: SAGE Publications
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1177/00037028261474595,
  title = {Synchrotron-Based X-ray Fluorescence Profiling of Asphaltene Deposits: Overcoming Atmospheric and Scattering Interferences for Enhanced Elemental Characterization},
  author = {Mohammad Rezaei-Pandari and Mohammad Ali Haddad and Roghaye Izan and Amir Sayid Hassan Rozatian and Messaoud Harfouche and Latif Ullah Khan},
  year = {2026},
  journal = {Applied Spectroscopy},
  doi = {10.1177/00037028261474595},
  url = {https://doi.org/10.1177/00037028261474595}
}

RIS

TY  - JOUR
TI  - Synchrotron-Based X-ray Fluorescence Profiling of Asphaltene Deposits: Overcoming Atmospheric and Scattering Interferences for Enhanced Elemental Characterization
AU  - Mohammad Rezaei-Pandari
AU  - Mohammad Ali Haddad
AU  - Roghaye Izan
AU  - Amir Sayid Hassan Rozatian
AU  - Messaoud Harfouche
AU  - Latif Ullah Khan
PY  - 2026
JO  - Applied Spectroscopy
DO  - 10.1177/00037028261474595
UR  - https://doi.org/10.1177/00037028261474595
ER  -

APA

Rezaei-Pandari, M., Haddad, M. A., Izan, R., Rozatian, A. S. H., Harfouche, M., & Khan, L. U. (2026). Synchrotron-Based X-ray Fluorescence Profiling of Asphaltene Deposits: Overcoming Atmospheric and Scattering Interferences for Enhanced Elemental Characterization. Applied Spectroscopy. https://doi.org/10.1177/00037028261474595

Source records

crossref · retrieved 2026-09-25T08:13:37.689Z