From the perspective of information leakage risk life cycle: Research on high-tech enterprise counter intelligence mechanism model

Yang Bo, Liao Yiming

DOI: 10.1177/0020720920940575
Published: 2020-07-28
Container: International Journal of Electrical Engineering & Education
Publisher: SAGE Publications
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1177/0020720920940575,
  title = {From the perspective of information leakage risk life cycle: Research on high-tech enterprise counter intelligence mechanism model},
  author = {Yang Bo and Liao Yiming},
  year = {2020},
  journal = {International Journal of Electrical Engineering \&amp; Education},
  doi = {10.1177/0020720920940575},
  url = {https://doi.org/10.1177/0020720920940575}
}

RIS

TY  - JOUR
TI  - From the perspective of information leakage risk life cycle: Research on high-tech enterprise counter intelligence mechanism model
AU  - Yang Bo
AU  - Liao Yiming
PY  - 2020
JO  - International Journal of Electrical Engineering &amp; Education
DO  - 10.1177/0020720920940575
UR  - https://doi.org/10.1177/0020720920940575
ER  -

APA

Bo, Y., & Yiming, L. (2020). From the perspective of information leakage risk life cycle: Research on high-tech enterprise counter intelligence mechanism model. International Journal of Electrical Engineering & Education. https://doi.org/10.1177/0020720920940575

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crossref · retrieved 2026-11-05T16:45:48.289Z