A Testlet Diagnostic Classification Model with Attribute Hierarchies

Wenchao Ma, Chun Wang, Jiaying Xiao

Open source

DOI: 10.1177/01466216231165315
Published: 2023-03-21
Container: Applied Psychological Measurement
Publisher: SAGE Publications
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1177/01466216231165315,
  title = {A Testlet Diagnostic Classification Model with Attribute Hierarchies},
  author = {Wenchao Ma and Chun Wang and Jiaying Xiao},
  year = {2023},
  journal = {Applied Psychological Measurement},
  doi = {10.1177/01466216231165315},
  url = {https://doi.org/10.1177/01466216231165315}
}

RIS

TY  - JOUR
TI  - A Testlet Diagnostic Classification Model with Attribute Hierarchies
AU  - Wenchao Ma
AU  - Chun Wang
AU  - Jiaying Xiao
PY  - 2023
JO  - Applied Psychological Measurement
DO  - 10.1177/01466216231165315
UR  - https://doi.org/10.1177/01466216231165315
ER  -

APA

Ma, W., Wang, C., & Xiao, J. (2023). A Testlet Diagnostic Classification Model with Attribute Hierarchies. Applied Psychological Measurement. https://doi.org/10.1177/01466216231165315

Source records

crossref · retrieved 2026-09-27T02:04:50.559Z