Conductive-probe atomic force microscopy characterization of silicon nanowire.

Alvarez J, Ngo I, Gueunier-Farret ME, Kleider JP, Yu L, Cabarrocas PR, Perraud S, Rouvière E, Celle C, Mouchet C, Simonato JP

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DOI: 10.1186/1556-276x-6-110
Published: 2011 Jan 31
Container: Nanoscale research letters
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1186/1556-276x-6-110,
  title = {Conductive-probe atomic force microscopy characterization of silicon nanowire.},
  author = {Alvarez J and Ngo I and Gueunier-Farret ME and Kleider JP and Yu L and Cabarrocas PR and Perraud S and Rouvière E and Celle C and Mouchet C and Simonato JP},
  year = {2011},
  journal = {Nanoscale research letters},
  doi = {10.1186/1556-276x-6-110},
  url = {https://doi.org/10.1186/1556-276x-6-110}
}

RIS

TY  - JOUR
TI  - Conductive-probe atomic force microscopy characterization of silicon nanowire.
AU  - Alvarez J
AU  - Ngo I
AU  - Gueunier-Farret ME
AU  - Kleider JP
AU  - Yu L
AU  - Cabarrocas PR
AU  - Perraud S
AU  - Rouvière E
AU  - Celle C
AU  - Mouchet C
AU  - Simonato JP
PY  - 2011
JO  - Nanoscale research letters
DO  - 10.1186/1556-276x-6-110
UR  - https://doi.org/10.1186/1556-276x-6-110
ER  -

APA

J, A., I, N., ME, G., JP, K., L, Y., PR, C., S, P., E, R., C, C., C, M., & JP, S. (2011). Conductive-probe atomic force microscopy characterization of silicon nanowire.. Nanoscale research letters. https://doi.org/10.1186/1556-276x-6-110

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pubmed · retrieved 2026-09-27T07:32:45.236Z