Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates
- DOI
- 10.1186/s11671-018-2804-y
- Published
- 2018-12
- Container
- Nanoscale Research Letters
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1186/s11671-018-2804-y,
title = {Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates},
author = {Ashutosh Kumar and Kazutaka Mitsuishi and Toru Hara and Koji Kimoto and Yoshihiro Irokawa and Toshihide Nabatame and Shinya Takashima and Katsunori Ueno and Masaharu Edo and Yasuo Koide},
year = {2018},
journal = {Nanoscale Research Letters},
doi = {10.1186/s11671-018-2804-y},
url = {https://doi.org/10.1186/s11671-018-2804-y}
}RIS
TY - JOUR TI - Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates AU - Ashutosh Kumar AU - Kazutaka Mitsuishi AU - Toru Hara AU - Koji Kimoto AU - Yoshihiro Irokawa AU - Toshihide Nabatame AU - Shinya Takashima AU - Katsunori Ueno AU - Masaharu Edo AU - Yasuo Koide PY - 2018 JO - Nanoscale Research Letters DO - 10.1186/s11671-018-2804-y UR - https://doi.org/10.1186/s11671-018-2804-y ER -
APA
Kumar, A., Mitsuishi, K., Hara, T., Kimoto, K., Irokawa, Y., Nabatame, T., Takashima, S., Ueno, K., Edo, M., & Koide, Y. (2018). Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates. Nanoscale Research Letters. https://doi.org/10.1186/s11671-018-2804-y
Source records
- crossref · retrieved 2026-09-26T19:46:56.249Z