Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.

Ma W, Peng Y, Wu Q, Zhang S, Sun L, Xiao W, Zhang C, Ma X, Hao Y

DOI: 10.1186/s11671-026-04582-x
Published: 2026 May 6
Container: Discover nano
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1186/s11671-026-04582-x,
  title = {Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.},
  author = {Ma W and Peng Y and Wu Q and Zhang S and Sun L and Xiao W and Zhang C and Ma X and Hao Y},
  year = {2026},
  journal = {Discover nano},
  doi = {10.1186/s11671-026-04582-x},
  url = {https://doi.org/10.1186/s11671-026-04582-x}
}

RIS

TY  - JOUR
TI  - Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.
AU  - Ma W
AU  - Peng Y
AU  - Wu Q
AU  - Zhang S
AU  - Sun L
AU  - Xiao W
AU  - Zhang C
AU  - Ma X
AU  - Hao Y
PY  - 2026
JO  - Discover nano
DO  - 10.1186/s11671-026-04582-x
UR  - https://doi.org/10.1186/s11671-026-04582-x
ER  -

APA

W, M., Y, P., Q, W., S, Z., L, S., W, X., C, Z., X, M., & Y, H. (2026). Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.. Discover nano. https://doi.org/10.1186/s11671-026-04582-x

Source records

pubmed · retrieved 2026-11-10T13:17:40.639Z