Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory

Sung-Ho Park, Jiseong Im, Jonghyun Ko, Joon Hwang, Yeongheon Yang, Jong-Won Back, Ryun-Han Koo, In-Seok Lee, Dongbeen Shin, Mingyun Oh, Gyuweon Jung, Jong-Ho Lee

Open source

DOI
10.1186/s40580-025-00513-1
Published
2025-09-30
Container
Nano Convergence
Publisher
Springer Science and Business Media LLC
Open access
unknown

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BibTeX

@article{allodium:10.1186/s40580-025-00513-1,
  title = {Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory},
  author = {Sung-Ho Park and Jiseong Im and Jonghyun Ko and Joon Hwang and Yeongheon Yang and Jong-Won Back and Ryun-Han Koo and In-Seok Lee and Dongbeen Shin and Mingyun Oh and Gyuweon Jung and Jong-Ho Lee},
  year = {2025},
  journal = {Nano Convergence},
  doi = {10.1186/s40580-025-00513-1},
  url = {https://doi.org/10.1186/s40580-025-00513-1}
}

RIS

TY  - JOUR
TI  - Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory
AU  - Sung-Ho Park
AU  - Jiseong Im
AU  - Jonghyun Ko
AU  - Joon Hwang
AU  - Yeongheon Yang
AU  - Jong-Won Back
AU  - Ryun-Han Koo
AU  - In-Seok Lee
AU  - Dongbeen Shin
AU  - Mingyun Oh
AU  - Gyuweon Jung
AU  - Jong-Ho Lee
PY  - 2025
JO  - Nano Convergence
DO  - 10.1186/s40580-025-00513-1
UR  - https://doi.org/10.1186/s40580-025-00513-1
ER  - 

APA

Park, S., Im, J., Ko, J., Hwang, J., Yang, Y., Back, J., Koo, R., Lee, I., Shin, D., Oh, M., Jung, G., & Lee, J. (2025). Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory. Nano Convergence. https://doi.org/10.1186/s40580-025-00513-1

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