Damage-free van der Waals metal/NbOx–NbSe2 integration for reliable and flexible memristor in neuromorphic computing

Thanh Luan Phan, Minh Chien Nguyen, Dang Xuan Dang, Van Tu Vu, Thi Thanh Huong Vu, Hong Woon Yun, Huamin Li, Jimin Lee, Max C. Lemme, Pallavi Aggarwal, Woo Jong Yu

Open source

DOI
10.1186/s40580-026-00569-7
Published
2026-08-06
Container
Nano Convergence
Publisher
Springer Science and Business Media LLC
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1186/s40580-026-00569-7,
  title = {Damage-free van der Waals metal/NbOx–NbSe2 integration for reliable and flexible memristor in neuromorphic computing},
  author = {Thanh Luan Phan and Minh Chien Nguyen and Dang Xuan Dang and Van Tu Vu and Thi Thanh Huong Vu and Hong Woon Yun and Huamin Li and Jimin Lee and Max C. Lemme and Pallavi Aggarwal and Woo Jong Yu},
  year = {2026},
  journal = {Nano Convergence},
  doi = {10.1186/s40580-026-00569-7},
  url = {https://doi.org/10.1186/s40580-026-00569-7}
}

RIS

TY  - JOUR
TI  - Damage-free van der Waals metal/NbOx–NbSe2 integration for reliable and flexible memristor in neuromorphic computing
AU  - Thanh Luan Phan
AU  - Minh Chien Nguyen
AU  - Dang Xuan Dang
AU  - Van Tu Vu
AU  - Thi Thanh Huong Vu
AU  - Hong Woon Yun
AU  - Huamin Li
AU  - Jimin Lee
AU  - Max C. Lemme
AU  - Pallavi Aggarwal
AU  - Woo Jong Yu
PY  - 2026
JO  - Nano Convergence
DO  - 10.1186/s40580-026-00569-7
UR  - https://doi.org/10.1186/s40580-026-00569-7
ER  - 

APA

Phan, T. L., Nguyen, M. C., Dang, D. X., Vu, V. T., Vu, T. T. H., Yun, H. W., Li, H., Lee, J., Lemme, M. C., Aggarwal, P., & Yu, W. J. (2026). Damage-free van der Waals metal/NbOx–NbSe2 integration for reliable and flexible memristor in neuromorphic computing. Nano Convergence. https://doi.org/10.1186/s40580-026-00569-7

Source records