Development of electron ptychography from algorithms, detectors to its applications

Wonwoo Suh, Jeewon B. Choi, Keun-Yeol Park, Celesta S. Chang

Open source

DOI: 10.1186/s42649-025-00119-1
Published: 2025-12-03
Container: Applied Microscopy
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1186/s42649-025-00119-1,
  title = {Development of electron ptychography from algorithms, detectors to its applications},
  author = {Wonwoo Suh and Jeewon B. Choi and Keun-Yeol Park and Celesta S. Chang},
  year = {2025},
  journal = {Applied Microscopy},
  doi = {10.1186/s42649-025-00119-1},
  url = {https://doi.org/10.1186/s42649-025-00119-1}
}

RIS

TY  - JOUR
TI  - Development of electron ptychography from algorithms, detectors to its applications
AU  - Wonwoo Suh
AU  - Jeewon B. Choi
AU  - Keun-Yeol Park
AU  - Celesta S. Chang
PY  - 2025
JO  - Applied Microscopy
DO  - 10.1186/s42649-025-00119-1
UR  - https://doi.org/10.1186/s42649-025-00119-1
ER  -

APA

Suh, W., Choi, J. B., Park, K., & Chang, C. S. (2025). Development of electron ptychography from algorithms, detectors to its applications. Applied Microscopy. https://doi.org/10.1186/s42649-025-00119-1

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crossref · retrieved 2026-09-26T18:55:01.835Z