Local bandgap and optoelectronic measurement using monochromated STEM-VEELS: fundamentals, challenges, and recent advances.

Jung HJ

DOI: 10.1186/s42649-026-00143-9
Published: 2026 Aug 28
Container: Applied microscopy
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1186/s42649-026-00143-9,
  title = {Local bandgap and optoelectronic measurement using monochromated STEM-VEELS: fundamentals, challenges, and recent advances.},
  author = {Jung HJ},
  year = {2026},
  journal = {Applied microscopy},
  doi = {10.1186/s42649-026-00143-9},
  url = {https://doi.org/10.1186/s42649-026-00143-9}
}

RIS

TY  - JOUR
TI  - Local bandgap and optoelectronic measurement using monochromated STEM-VEELS: fundamentals, challenges, and recent advances.
AU  - Jung HJ
PY  - 2026
JO  - Applied microscopy
DO  - 10.1186/s42649-026-00143-9
UR  - https://doi.org/10.1186/s42649-026-00143-9
ER  -

APA

HJ, J. (2026). Local bandgap and optoelectronic measurement using monochromated STEM-VEELS: fundamentals, challenges, and recent advances.. Applied microscopy. https://doi.org/10.1186/s42649-026-00143-9

Source records

pubmed · retrieved 2026-09-25T21:24:46.007Z