Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing

Michael Baron, Choudur K Lakshminarayan, Zhenwu Chen

Open source

DOI: 10.1198/00401700152404336
Published: 2001-02
Container: Technometrics
Publisher: Informa UK Limited
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1198/00401700152404336,
  title = {Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing},
  author = {Michael Baron and Choudur K Lakshminarayan and Zhenwu Chen},
  year = {2001},
  journal = {Technometrics},
  doi = {10.1198/00401700152404336},
  url = {https://doi.org/10.1198/00401700152404336}
}

RIS

TY  - JOUR
TI  - Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing
AU  - Michael Baron
AU  - Choudur K Lakshminarayan
AU  - Zhenwu Chen
PY  - 2001
JO  - Technometrics
DO  - 10.1198/00401700152404336
UR  - https://doi.org/10.1198/00401700152404336
ER  -

APA

Baron, M., Lakshminarayan, C. K., & Chen, Z. (2001). Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing. Technometrics. https://doi.org/10.1198/00401700152404336

Source records

crossref · retrieved 2026-09-25T16:47:30.134Z