Mitigating the Resolution-Field of View Trade-Off for Comprehensive Microstructural Characterization with Advanced AI Methods.

Pokhrel AR, Das J, Ke B, Ma L, Zhang S, Korang-Yeboah M.

DOI: 10.1208/s12249-026-03558-5
Published: 2026-09-29
Container: AAPS PharmSciTech
Publisher: Not recorded
Open access: no

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Cite this work

BibTeX

@article{allodium:10.1208/s12249-026-03558-5,
  title = {Mitigating the Resolution-Field of View Trade-Off for Comprehensive Microstructural Characterization with Advanced AI Methods.},
  author = {Pokhrel AR and  Das J and  Ke B and  Ma L and  Zhang S and  Korang-Yeboah M.},
  year = {2026},
  journal = {AAPS PharmSciTech},
  doi = {10.1208/s12249-026-03558-5},
  url = {https://doi.org/10.1208/s12249-026-03558-5}
}

RIS

TY  - JOUR
TI  - Mitigating the Resolution-Field of View Trade-Off for Comprehensive Microstructural Characterization with Advanced AI Methods.
AU  - Pokhrel AR
AU  -  Das J
AU  -  Ke B
AU  -  Ma L
AU  -  Zhang S
AU  -  Korang-Yeboah M.
PY  - 2026
JO  - AAPS PharmSciTech
DO  - 10.1208/s12249-026-03558-5
UR  - https://doi.org/10.1208/s12249-026-03558-5
ER  -

APA

AR, P., J, D., B, K., L, M., S, Z., & M., K. (2026). Mitigating the Resolution-Field of View Trade-Off for Comprehensive Microstructural Characterization with Advanced AI Methods.. AAPS PharmSciTech. https://doi.org/10.1208/s12249-026-03558-5

Source records

europe-pmc · retrieved 2026-11-10T13:11:56.227Z