Characterization and structural analysis of RF magnetron sputtered strontium stannate thin films

Yusmar Palapa Wijaya, Khairul Anuar Mohamad, Abu Bakar Abdul Rahman, Afishah Alias, Mohammad Syahmi Nordin

Open source

DOI: 10.12928/telkomnika.v19i4.18790
Published: 2021-08-01
Container: TELKOMNIKA (Telecommunication Computing Electronics and Control)
Publisher: Universitas Ahmad Dahlan
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.12928/telkomnika.v19i4.18790,
  title = {Characterization and structural analysis of RF magnetron sputtered strontium stannate thin films},
  author = {Yusmar Palapa Wijaya and Khairul Anuar Mohamad and Abu Bakar Abdul Rahman and Afishah Alias and Mohammad Syahmi Nordin},
  year = {2021},
  journal = {TELKOMNIKA (Telecommunication Computing Electronics and Control)},
  doi = {10.12928/telkomnika.v19i4.18790},
  url = {https://doi.org/10.12928/telkomnika.v19i4.18790}
}

RIS

TY  - JOUR
TI  - Characterization and structural analysis of RF magnetron sputtered strontium stannate thin films
AU  - Yusmar Palapa Wijaya
AU  - Khairul Anuar Mohamad
AU  - Abu Bakar Abdul Rahman
AU  - Afishah Alias
AU  - Mohammad Syahmi Nordin
PY  - 2021
JO  - TELKOMNIKA (Telecommunication Computing Electronics and Control)
DO  - 10.12928/telkomnika.v19i4.18790
UR  - https://doi.org/10.12928/telkomnika.v19i4.18790
ER  -

APA

Wijaya, Y. P., Mohamad, K. A., Rahman, A. B. A., Alias, A., & Nordin, M. S. (2021). Characterization and structural analysis of RF magnetron sputtered strontium stannate thin films. TELKOMNIKA (Telecommunication Computing Electronics and Control). https://doi.org/10.12928/telkomnika.v19i4.18790

Source records

crossref · retrieved 2026-09-26T20:23:14.021Z