Fraunhofer Institute of Optronics, System Technologies and Image Exploitation: introduction to the focus issue.

Gładysz S, Beyerer J, Eichhorn M

DOI: 10.1364/ao.437732
Published: 2021 Aug 1
Container: Applied optics
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/ao.437732,
  title = {Fraunhofer Institute of Optronics, System Technologies and Image Exploitation: introduction to the focus issue.},
  author = {Gładysz S and Beyerer J and Eichhorn M},
  year = {2021},
  journal = {Applied optics},
  doi = {10.1364/ao.437732},
  url = {https://doi.org/10.1364/ao.437732}
}

RIS

TY  - JOUR
TI  - Fraunhofer Institute of Optronics, System Technologies and Image Exploitation: introduction to the focus issue.
AU  - Gładysz S
AU  - Beyerer J
AU  - Eichhorn M
PY  - 2021
JO  - Applied optics
DO  - 10.1364/ao.437732
UR  - https://doi.org/10.1364/ao.437732
ER  -

APA

S, G., J, B., & M, E. (2021). Fraunhofer Institute of Optronics, System Technologies and Image Exploitation: introduction to the focus issue.. Applied optics. https://doi.org/10.1364/ao.437732

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pubmed · retrieved 2026-09-24T21:23:21.254Z