Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity.

Das A, Gupta RK, Modi MH, Mukherjee C, Rai SK, Bose A, Ganguli T, Joshi SC, Lodha GS, Deb SK

Open source

DOI
10.1364/ao.51.007402
Published
2012 Oct 20
Container
Applied optics
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1364/ao.51.007402,
  title = {Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity.},
  author = {Das A and Gupta RK and Modi MH and Mukherjee C and Rai SK and Bose A and Ganguli T and Joshi SC and Lodha GS and Deb SK},
  year = {2012},
  journal = {Applied optics},
  doi = {10.1364/ao.51.007402},
  url = {https://doi.org/10.1364/ao.51.007402}
}

RIS

TY  - JOUR
TI  - Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity.
AU  - Das A
AU  - Gupta RK
AU  - Modi MH
AU  - Mukherjee C
AU  - Rai SK
AU  - Bose A
AU  - Ganguli T
AU  - Joshi SC
AU  - Lodha GS
AU  - Deb SK
PY  - 2012
JO  - Applied optics
DO  - 10.1364/ao.51.007402
UR  - https://doi.org/10.1364/ao.51.007402
ER  - 

APA

A, D., RK, G., MH, M., C, M., SK, R., A, B., T, G., SC, J., GS, L., & SK, D. (2012). Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity.. Applied optics. https://doi.org/10.1364/ao.51.007402

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