Effect of laser pulse width (ns-fs) on laser-induced damage thresholds of a CMOS photodetector.

Wang J, Bu F, Gao X, Jia D.

DOI: 10.1364/ao.604136
Published: 2026-08-01
Container: Appl Opt
Publisher: Not recorded
Open access: no

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Cite this work

BibTeX

@article{allodium:10.1364/ao.604136,
  title = {Effect of laser pulse width (ns-fs) on laser-induced damage thresholds of a CMOS photodetector.},
  author = {Wang J and  Bu F and  Gao X and  Jia D.},
  year = {2026},
  journal = {Appl Opt},
  doi = {10.1364/ao.604136},
  url = {https://doi.org/10.1364/ao.604136}
}

RIS

TY  - JOUR
TI  - Effect of laser pulse width (ns-fs) on laser-induced damage thresholds of a CMOS photodetector.
AU  - Wang J
AU  -  Bu F
AU  -  Gao X
AU  -  Jia D.
PY  - 2026
JO  - Appl Opt
DO  - 10.1364/ao.604136
UR  - https://doi.org/10.1364/ao.604136
ER  -

APA

J, W., F, B., X, G., & D., J. (2026). Effect of laser pulse width (ns-fs) on laser-induced damage thresholds of a CMOS photodetector.. Appl Opt. https://doi.org/10.1364/ao.604136

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europe-pmc · retrieved 2026-09-26T02:59:53.943Z