High-precision thickness measurement via dual-path oblique laser triangulation and spatial-topological constraints
- DOI
- 10.1364/ao.605323
- Published
- 2026-10-06
- Container
- Applied Optics
- Publisher
- Optica Publishing Group
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1364/ao.605323,
title = {High-precision thickness measurement via dual-path oblique laser triangulation and spatial-topological constraints},
author = {Kaijin Wang and Bicheng Yuan and Youwei Xu and Nan Zhang and Weiquan Mo and Dawei Li and Kun Liu and Hao Sun},
year = {2026},
journal = {Applied Optics},
doi = {10.1364/ao.605323},
url = {https://doi.org/10.1364/ao.605323}
}RIS
TY - JOUR TI - High-precision thickness measurement via dual-path oblique laser triangulation and spatial-topological constraints AU - Kaijin Wang AU - Bicheng Yuan AU - Youwei Xu AU - Nan Zhang AU - Weiquan Mo AU - Dawei Li AU - Kun Liu AU - Hao Sun PY - 2026 JO - Applied Optics DO - 10.1364/ao.605323 UR - https://doi.org/10.1364/ao.605323 ER -
APA
Wang, K., Yuan, B., Xu, Y., Zhang, N., Mo, W., Li, D., Liu, K., & Sun, H. (2026). High-precision thickness measurement via dual-path oblique laser triangulation and spatial-topological constraints. Applied Optics. https://doi.org/10.1364/ao.605323
Source records
- crossref · retrieved 2026-11-10T09:16:58.478Z