High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments
- DOI
- 10.1364/ao.607587
- Published
- 2026-07-27
- Container
- Applied Optics
- Publisher
- Optica Publishing Group
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1364/ao.607587,
title = {High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments},
author = {Swetha Velpula and Mano Bala Sankar Muthu and Ravi Teja Velpula and Injamamul Hoque Emu and Tamara Faranaz Ena and Hoang-duy Nguyen and Hieu Pham Trung Nguyen},
year = {2026},
journal = {Applied Optics},
doi = {10.1364/ao.607587},
url = {https://doi.org/10.1364/ao.607587}
}RIS
TY - JOUR TI - High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments AU - Swetha Velpula AU - Mano Bala Sankar Muthu AU - Ravi Teja Velpula AU - Injamamul Hoque Emu AU - Tamara Faranaz Ena AU - Hoang-duy Nguyen AU - Hieu Pham Trung Nguyen PY - 2026 JO - Applied Optics DO - 10.1364/ao.607587 UR - https://doi.org/10.1364/ao.607587 ER -
APA
Velpula, S., Muthu, M. B. S., Velpula, R. T., Emu, I. H., Ena, T. F., Nguyen, H., & Nguyen, H. P. T. (2026). High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments. Applied Optics. https://doi.org/10.1364/ao.607587
Source records
- crossref · retrieved 2026-11-06T04:46:43.230Z