Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry.

Koch FJ, Detlefs C, Schröter TJ, Kunka D, Last A, Mohr J

DOI: 10.1364/oe.24.009168
Published: 2016 May 2
Container: Optics express
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/oe.24.009168,
  title = {Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry.},
  author = {Koch FJ and Detlefs C and Schröter TJ and Kunka D and Last A and Mohr J},
  year = {2016},
  journal = {Optics express},
  doi = {10.1364/oe.24.009168},
  url = {https://doi.org/10.1364/oe.24.009168}
}

RIS

TY  - JOUR
TI  - Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry.
AU  - Koch FJ
AU  - Detlefs C
AU  - Schröter TJ
AU  - Kunka D
AU  - Last A
AU  - Mohr J
PY  - 2016
JO  - Optics express
DO  - 10.1364/oe.24.009168
UR  - https://doi.org/10.1364/oe.24.009168
ER  -

APA

FJ, K., C, D., TJ, S., D, K., A, L., & J, M. (2016). Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry.. Optics express. https://doi.org/10.1364/oe.24.009168

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pubmed · retrieved 2026-11-10T08:25:54.267Z