High-temperature strain measurement method based on scanning infrared signals.

Lin F, Lin C, Zou W, Liu X, Zhang Z, Jiang J, Niu Y, Yu P, Niu Y, Wang C

DOI: 10.1364/oe.566782
Published: 2025 Aug 25
Container: Optics express
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/oe.566782,
  title = {High-temperature strain measurement method based on scanning infrared signals.},
  author = {Lin F and Lin C and Zou W and Liu X and Zhang Z and Jiang J and Niu Y and Yu P and Niu Y and Wang C},
  year = {2025},
  journal = {Optics express},
  doi = {10.1364/oe.566782},
  url = {https://doi.org/10.1364/oe.566782}
}

RIS

TY  - JOUR
TI  - High-temperature strain measurement method based on scanning infrared signals.
AU  - Lin F
AU  - Lin C
AU  - Zou W
AU  - Liu X
AU  - Zhang Z
AU  - Jiang J
AU  - Niu Y
AU  - Yu P
AU  - Niu Y
AU  - Wang C
PY  - 2025
JO  - Optics express
DO  - 10.1364/oe.566782
UR  - https://doi.org/10.1364/oe.566782
ER  -

APA

F, L., C, L., W, Z., X, L., Z, Z., J, J., Y, N., P, Y., Y, N., & C, W. (2025). High-temperature strain measurement method based on scanning infrared signals.. Optics express. https://doi.org/10.1364/oe.566782

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pubmed · retrieved 2026-09-25T02:35:11.169Z