On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum.

Gautheron A, Clerc R, Duveiller V, Simonot L, Montcel B, Hébert M

Open source

DOI
10.1364/oe.587542
Published
2026 Jan 26
Container
Optics express
Publisher
Not recorded
Open access
unknown

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BibTeX

@article{allodium:10.1364/oe.587542,
  title = {On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum.},
  author = {Gautheron A and Clerc R and Duveiller V and Simonot L and Montcel B and Hébert M},
  year = {2026},
  journal = {Optics express},
  doi = {10.1364/oe.587542},
  url = {https://doi.org/10.1364/oe.587542}
}

RIS

TY  - JOUR
TI  - On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum.
AU  - Gautheron A
AU  - Clerc R
AU  - Duveiller V
AU  - Simonot L
AU  - Montcel B
AU  - Hébert M
PY  - 2026
JO  - Optics express
DO  - 10.1364/oe.587542
UR  - https://doi.org/10.1364/oe.587542
ER  - 

APA

A, G., R, C., V, D., L, S., B, M., & M, H. (2026). On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum.. Optics express. https://doi.org/10.1364/oe.587542

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