Quantum metrology under coarse-grained measurement.

Go BY, Gwak G, Yoon YD, Lee S, Treps N, Park J, Ra YS

DOI: 10.1364/oe.592671
Published: 2026 May 4
Container: Optics express
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/oe.592671,
  title = {Quantum metrology under coarse-grained measurement.},
  author = {Go BY and Gwak G and Yoon YD and Lee S and Treps N and Park J and Ra YS},
  year = {2026},
  journal = {Optics express},
  doi = {10.1364/oe.592671},
  url = {https://doi.org/10.1364/oe.592671}
}

RIS

TY  - JOUR
TI  - Quantum metrology under coarse-grained measurement.
AU  - Go BY
AU  - Gwak G
AU  - Yoon YD
AU  - Lee S
AU  - Treps N
AU  - Park J
AU  - Ra YS
PY  - 2026
JO  - Optics express
DO  - 10.1364/oe.592671
UR  - https://doi.org/10.1364/oe.592671
ER  -

APA

BY, G., G, G., YD, Y., S, L., N, T., J, P., & YS, R. (2026). Quantum metrology under coarse-grained measurement.. Optics express. https://doi.org/10.1364/oe.592671

Source records

pubmed · retrieved 2026-11-10T09:10:51.976Z