High-sensitivity wide-field defect detection using single-shot hybrid finite-difference phase microscopy

Zedi Li, Jinsong Zhang, Wenyu Chen, Shuyao Jiang, Jinlong Zhu

Open source

DOI: 10.1364/ol.600575
Published: 2026-06-23
Container: Optics Letters
Publisher: Optica Publishing Group
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/ol.600575,
  title = {High-sensitivity wide-field defect detection using single-shot hybrid finite-difference phase microscopy},
  author = {Zedi Li and Jinsong Zhang and Wenyu Chen and Shuyao Jiang and Jinlong Zhu},
  year = {2026},
  journal = {Optics Letters},
  doi = {10.1364/ol.600575},
  url = {https://doi.org/10.1364/ol.600575}
}

RIS

TY  - JOUR
TI  - High-sensitivity wide-field defect detection using single-shot hybrid finite-difference phase microscopy
AU  - Zedi Li
AU  - Jinsong Zhang
AU  - Wenyu Chen
AU  - Shuyao Jiang
AU  - Jinlong Zhu
PY  - 2026
JO  - Optics Letters
DO  - 10.1364/ol.600575
UR  - https://doi.org/10.1364/ol.600575
ER  -

APA

Li, Z., Zhang, J., Chen, W., Jiang, S., & Zhu, J. (2026). High-sensitivity wide-field defect detection using single-shot hybrid finite-difference phase microscopy. Optics Letters. https://doi.org/10.1364/ol.600575

Source records

crossref · retrieved 2026-11-05T22:28:11.399Z