Azimuthal-rotation evanescent-wave illumination incoherent scattering microscopy (AR-EISM) for label-free, high-contrast imaging.

Yang S, Qi D, Tang Q, Ye R, Ye YH

DOI: 10.1364/ol.614608
Published: 2026 Nov 1
Container: Optics letters
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1364/ol.614608,
  title = {Azimuthal-rotation evanescent-wave illumination incoherent scattering microscopy (AR-EISM) for label-free, high-contrast imaging.},
  author = {Yang S and Qi D and Tang Q and Ye R and Ye YH},
  year = {2026},
  journal = {Optics letters},
  doi = {10.1364/ol.614608},
  url = {https://doi.org/10.1364/ol.614608}
}

RIS

TY  - JOUR
TI  - Azimuthal-rotation evanescent-wave illumination incoherent scattering microscopy (AR-EISM) for label-free, high-contrast imaging.
AU  - Yang S
AU  - Qi D
AU  - Tang Q
AU  - Ye R
AU  - Ye YH
PY  - 2026
JO  - Optics letters
DO  - 10.1364/ol.614608
UR  - https://doi.org/10.1364/ol.614608
ER  -

APA

S, Y., D, Q., Q, T., R, Y., & YH, Y. (2026). Azimuthal-rotation evanescent-wave illumination incoherent scattering microscopy (AR-EISM) for label-free, high-contrast imaging.. Optics letters. https://doi.org/10.1364/ol.614608

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pubmed · retrieved 2026-11-10T06:53:15.199Z