A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention.

Dhar S, Al Farid F, Islam MS, Uddin J, Mansor S.

Open source

DOI: 10.1371/journal.pone.0346595
Published: 2026-04-08
Container: PLoS One
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1371/journal.pone.0346595,
  title = {A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention.},
  author = {Dhar S and  Al Farid F and  Islam MS and  Uddin J and  Mansor S.},
  year = {2026},
  journal = {PLoS One},
  doi = {10.1371/journal.pone.0346595},
  url = {https://doi.org/10.1371/journal.pone.0346595}
}

RIS

TY  - JOUR
TI  - A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention.
AU  - Dhar S
AU  -  Al Farid F
AU  -  Islam MS
AU  -  Uddin J
AU  -  Mansor S.
PY  - 2026
JO  - PLoS One
DO  - 10.1371/journal.pone.0346595
UR  - https://doi.org/10.1371/journal.pone.0346595
ER  -

APA

S, D., F, A. F., MS, I., J, U., & S., M. (2026). A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention.. PLoS One. https://doi.org/10.1371/journal.pone.0346595

Source records

europe-pmc · retrieved 2026-09-25T06:57:15.960Z
doaj · retrieved 2026-09-25T06:57:15.967Z