Quantum-enhanced wafer failure prediction in semiconductor fabrication.

Kapuluru CSS, Kukunuri S, Chinnadurai S, Shaik R, Naganaboina VR, Reddy GP, Choi YS

DOI: 10.1371/journal.pone.0361400
Published: 2026
Container: PloS one
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1371/journal.pone.0361400,
  title = {Quantum-enhanced wafer failure prediction in semiconductor fabrication.},
  author = {Kapuluru CSS and Kukunuri S and Chinnadurai S and Shaik R and Naganaboina VR and Reddy GP and Choi YS},
  year = {2026},
  journal = {PloS one},
  doi = {10.1371/journal.pone.0361400},
  url = {https://doi.org/10.1371/journal.pone.0361400}
}

RIS

TY  - JOUR
TI  - Quantum-enhanced wafer failure prediction in semiconductor fabrication.
AU  - Kapuluru CSS
AU  - Kukunuri S
AU  - Chinnadurai S
AU  - Shaik R
AU  - Naganaboina VR
AU  - Reddy GP
AU  - Choi YS
PY  - 2026
JO  - PloS one
DO  - 10.1371/journal.pone.0361400
UR  - https://doi.org/10.1371/journal.pone.0361400
ER  -

APA

CSS, K., S, K., S, C., R, S., VR, N., GP, R., & YS, C. (2026). Quantum-enhanced wafer failure prediction in semiconductor fabrication.. PloS one. https://doi.org/10.1371/journal.pone.0361400

Source records

pubmed · retrieved 2026-11-11T01:03:57.661Z