Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance

Yoshinori Sakaguchi, Seiichi Ozawa, Manabu Kotani

Open source

DOI: 10.1541/ieejeiss.124.157
Published: 2004
Container: IEEJ Transactions on Electronics, Information and Systems
Publisher: Institute of Electrical Engineers of Japan (IEE Japan)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1541/ieejeiss.124.157,
  title = {Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance},
  author = {Yoshinori Sakaguchi and Seiichi Ozawa and Manabu Kotani},
  year = {2004},
  journal = {IEEJ Transactions on Electronics, Information and Systems},
  doi = {10.1541/ieejeiss.124.157},
  url = {https://doi.org/10.1541/ieejeiss.124.157}
}

RIS

TY  - JOUR
TI  - Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance
AU  - Yoshinori Sakaguchi
AU  - Seiichi Ozawa
AU  - Manabu Kotani
PY  - 2004
JO  - IEEJ Transactions on Electronics, Information and Systems
DO  - 10.1541/ieejeiss.124.157
UR  - https://doi.org/10.1541/ieejeiss.124.157
ER  -

APA

Sakaguchi, Y., Ozawa, S., & Kotani, M. (2004). Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance. IEEJ Transactions on Electronics, Information and Systems. https://doi.org/10.1541/ieejeiss.124.157

Source records

crossref · retrieved 2026-09-26T22:08:42.940Z