Dielectric Metrology VIA Microwave Tomography: Present and Future

J.Ch. Bolomey, N. Joachimowicz

Open source

DOI: 10.1557/proc-347-259
Published: 1994
Container: MRS Proceedings
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1557/proc-347-259,
  title = {Dielectric Metrology VIA Microwave Tomography: Present and Future},
  author = {J.Ch. Bolomey and N. Joachimowicz},
  year = {1994},
  journal = {MRS Proceedings},
  doi = {10.1557/proc-347-259},
  url = {https://doi.org/10.1557/proc-347-259}
}

RIS

TY  - JOUR
TI  - Dielectric Metrology VIA Microwave Tomography: Present and Future
AU  - J.Ch. Bolomey
AU  - N. Joachimowicz
PY  - 1994
JO  - MRS Proceedings
DO  - 10.1557/proc-347-259
UR  - https://doi.org/10.1557/proc-347-259
ER  -

APA

Bolomey, J., & Joachimowicz, N. (1994). Dielectric Metrology VIA Microwave Tomography: Present and Future. MRS Proceedings. https://doi.org/10.1557/proc-347-259

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crossref · retrieved 2026-09-26T17:33:29.650Z