Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking

Chen, Shantong, He, Yuan, Luo, Didi, Tan, Teng

DOI: 10.18429/jacow-srf2025-mop17
Published: 2026
Container: Not recorded
Publisher: JACoW Publishing
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.18429/jacow-srf2025-mop17,
  title = {Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking},
  author = {Chen, Shantong and He, Yuan and Luo, Didi and Tan, Teng},
  year = {2026},
  doi = {10.18429/jacow-srf2025-mop17},
  url = {https://doi.org/10.18429/jacow-srf2025-mop17}
}

RIS

TY  - JOUR
TI  - Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking
AU  - Chen, Shantong
AU  - He, Yuan
AU  - Luo, Didi
AU  - Tan, Teng
PY  - 2026
DO  - 10.18429/jacow-srf2025-mop17
UR  - https://doi.org/10.18429/jacow-srf2025-mop17
ER  -

APA

Shantong, C., Yuan, H., Didi, L., & Teng, T. (2026). Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking. https://doi.org/10.18429/jacow-srf2025-mop17

Source records

datacite · retrieved 2026-09-26T01:18:54.243Z