Hybridization of Ellipsometry and Xps Energy Loss: Robust Band Gap and Broadband Optical Constants Determination of Sige, Hfon and Moox Thin Films
- DOI
- 10.2139/ssrn.4554544
- Published
- 2023
- Container
- Not recorded
- Publisher
- Elsevier BV
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.2139/ssrn.4554544,
title = {Hybridization of Ellipsometry and Xps Energy Loss: Robust Band Gap and Broadband Optical Constants Determination of Sige, Hfon and Moox Thin Films},
author = {Théo Levert and Alter Zakhtser and Julien Duval and Chloé Raguenez and Stéphane Verdier and Delphine Le Cunff and Jean-Hervé Tortai and Bernard Pelissier},
year = {2023},
doi = {10.2139/ssrn.4554544},
url = {https://doi.org/10.2139/ssrn.4554544}
}RIS
TY - JOUR TI - Hybridization of Ellipsometry and Xps Energy Loss: Robust Band Gap and Broadband Optical Constants Determination of Sige, Hfon and Moox Thin Films AU - Théo Levert AU - Alter Zakhtser AU - Julien Duval AU - Chloé Raguenez AU - Stéphane Verdier AU - Delphine Le Cunff AU - Jean-Hervé Tortai AU - Bernard Pelissier PY - 2023 DO - 10.2139/ssrn.4554544 UR - https://doi.org/10.2139/ssrn.4554544 ER -
APA
Levert, T., Zakhtser, A., Duval, J., Raguenez, C., Verdier, S., Cunff, D. L., Tortai, J., & Pelissier, B. (2023). Hybridization of Ellipsometry and Xps Energy Loss: Robust Band Gap and Broadband Optical Constants Determination of Sige, Hfon and Moox Thin Films. https://doi.org/10.2139/ssrn.4554544
Source records
- crossref · retrieved 2026-09-25T07:55:31.639Z