Measurement-induced criticality in extended and long-range unitary circuits

Shraddha Sharma, Xhek Turkeshi, Rosario Fazio, Marcello Dalmonte

Open source

DOI: 10.21468/scipostphyscore.5.2.023
Published: 2022-04-21
Container: SciPost Physics Core
Publisher: Stichting SciPost
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.21468/scipostphyscore.5.2.023,
  title = {Measurement-induced criticality in extended and long-range unitary  circuits},
  author = {Shraddha Sharma and Xhek Turkeshi and Rosario Fazio and Marcello Dalmonte},
  year = {2022},
  journal = {SciPost Physics Core},
  doi = {10.21468/scipostphyscore.5.2.023},
  url = {https://doi.org/10.21468/scipostphyscore.5.2.023}
}

RIS

TY  - JOUR
TI  - Measurement-induced criticality in extended and long-range unitary  circuits
AU  - Shraddha Sharma
AU  - Xhek Turkeshi
AU  - Rosario Fazio
AU  - Marcello Dalmonte
PY  - 2022
JO  - SciPost Physics Core
DO  - 10.21468/scipostphyscore.5.2.023
UR  - https://doi.org/10.21468/scipostphyscore.5.2.023
ER  -

APA

Sharma, S., Turkeshi, X., Fazio, R., & Dalmonte, M. (2022). Measurement-induced criticality in extended and long-range unitary circuits. SciPost Physics Core. https://doi.org/10.21468/scipostphyscore.5.2.023

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crossref · retrieved 2026-09-25T02:11:29.769Z