Application of machine learning to the nanobeam electron diffraction for strain analysis

Unknown, Svetlana Korneychuk

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DOI: 10.22443/rms.emc2020.1427
Published: 2021-03-01
Container: Proceedings of the European Microscopy Congress 2020
Publisher: Royal Microscopical Society
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.22443/rms.emc2020.1427,
  title = {Application of machine learning to the nanobeam electron diffraction for strain analysis},
  author = {Unknown and Svetlana Korneychuk},
  year = {2021},
  journal = {Proceedings of the European Microscopy Congress 2020},
  doi = {10.22443/rms.emc2020.1427},
  url = {https://doi.org/10.22443/rms.emc2020.1427}
}

RIS

TY  - JOUR
TI  - Application of machine learning to the nanobeam electron diffraction for strain analysis
AU  - Unknown
AU  - Svetlana Korneychuk
PY  - 2021
JO  - Proceedings of the European Microscopy Congress 2020
DO  - 10.22443/rms.emc2020.1427
UR  - https://doi.org/10.22443/rms.emc2020.1427
ER  -

APA

Unknown, & Korneychuk, S. (2021). Application of machine learning to the nanobeam electron diffraction for strain analysis. Proceedings of the European Microscopy Congress 2020. https://doi.org/10.22443/rms.emc2020.1427

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crossref · retrieved 2026-09-25T06:38:03.872Z