A Universal Method of Specimen Preparation for Transmission Electron Microscopy Using Broad-Beam Ion Milling

Vladimir I. Vdovin, Anton K. Gutakovskii

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DOI: 10.22541/au.174114924.47403719/v1
Published: 2025-03-05
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Publisher: Wiley
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Cite this work

BibTeX

@article{allodium:10.22541/au.174114924.47403719/v1,
  title = {A Universal Method of Specimen Preparation for Transmission Electron Microscopy Using Broad-Beam Ion Milling},
  author = {Vladimir I. Vdovin and Anton K. Gutakovskii},
  year = {2025},
  doi = {10.22541/au.174114924.47403719/v1},
  url = {https://doi.org/10.22541/au.174114924.47403719/v1}
}

RIS

TY  - JOUR
TI  - A Universal Method of Specimen Preparation for Transmission Electron Microscopy Using Broad-Beam Ion Milling
AU  - Vladimir I. Vdovin
AU  - Anton K. Gutakovskii
PY  - 2025
DO  - 10.22541/au.174114924.47403719/v1
UR  - https://doi.org/10.22541/au.174114924.47403719/v1
ER  -

APA

Vdovin, V. I., & Gutakovskii, A. K. (2025). A Universal Method of Specimen Preparation for Transmission Electron Microscopy Using Broad-Beam Ion Milling. https://doi.org/10.22541/au.174114924.47403719/v1

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crossref · retrieved 2026-11-10T16:42:48.327Z