Microelectronic reliability models for more than moore nanotechnology products

Alain Bensoussan

Open source

DOI: 10.2298/fuee1701001b
Published: 2017
Container: Facta universitatis - series: Electronics and Energetics
Publisher: National Library of Serbia
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.2298/fuee1701001b,
  title = {Microelectronic reliability models for more than moore nanotechnology products},
  author = {Alain Bensoussan},
  year = {2017},
  journal = {Facta universitatis - series: Electronics and Energetics},
  doi = {10.2298/fuee1701001b},
  url = {https://doi.org/10.2298/fuee1701001b}
}

RIS

TY  - JOUR
TI  - Microelectronic reliability models for more than moore nanotechnology products
AU  - Alain Bensoussan
PY  - 2017
JO  - Facta universitatis - series: Electronics and Energetics
DO  - 10.2298/fuee1701001b
UR  - https://doi.org/10.2298/fuee1701001b
ER  -

APA

Bensoussan, A. (2017). Microelectronic reliability models for more than moore nanotechnology products. Facta universitatis - series: Electronics and Energetics. https://doi.org/10.2298/fuee1701001b

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crossref · retrieved 2026-09-25T20:16:05.996Z