From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry
- DOI
- 10.23919/ecc54610.2021.9655083
- Published
- 2021-06-29
- Container
- 2021 European Control Conference (ECC)
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.23919/ecc54610.2021.9655083,
title = {From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry},
author = {Mohammed Al-Kharaz and Bouchra Ananou and Mustapha Ouladsine and Michel Combal and Jacques Pinaton},
year = {2021},
journal = {2021 European Control Conference (ECC)},
doi = {10.23919/ecc54610.2021.9655083},
url = {https://doi.org/10.23919/ecc54610.2021.9655083}
}RIS
TY - JOUR TI - From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry AU - Mohammed Al-Kharaz AU - Bouchra Ananou AU - Mustapha Ouladsine AU - Michel Combal AU - Jacques Pinaton PY - 2021 JO - 2021 European Control Conference (ECC) DO - 10.23919/ecc54610.2021.9655083 UR - https://doi.org/10.23919/ecc54610.2021.9655083 ER -
APA
Al-Kharaz, M., Ananou, B., Ouladsine, M., Combal, M., & Pinaton, J. (2021). From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. 2021 European Control Conference (ECC). https://doi.org/10.23919/ecc54610.2021.9655083
Source records
- crossref · retrieved 2026-09-25T23:30:06.874Z