Early-design assessment of the susceptibility of embedded software to radiation-induced soft errors

Alex Hanneman

DOI: 10.26174/thesis.lboro.34867215.v1
Published: 2026
Container: Not recorded
Publisher: Loughborough University
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.26174/thesis.lboro.34867215.v1,
  title = {Early-design assessment of the susceptibility of embedded software to radiation-induced soft errors},
  author = {Alex Hanneman},
  year = {2026},
  doi = {10.26174/thesis.lboro.34867215.v1},
  url = {https://doi.org/10.26174/thesis.lboro.34867215.v1}
}

RIS

TY  - JOUR
TI  - Early-design assessment of the susceptibility of embedded software to radiation-induced soft errors
AU  - Alex Hanneman
PY  - 2026
DO  - 10.26174/thesis.lboro.34867215.v1
UR  - https://doi.org/10.26174/thesis.lboro.34867215.v1
ER  -

APA

Hanneman, A. (2026). Early-design assessment of the susceptibility of embedded software to radiation-induced soft errors. https://doi.org/10.26174/thesis.lboro.34867215.v1

Source records

datacite · retrieved 2026-11-10T13:57:33.558Z