ANALYTICAL METHOD FOR ASSESSING SOFT ERROR RATES IN DIGITAL ELECTRONICS INDUCED BY GALACTIC COSMIC RAYS

Gennady I. Zebrev, Alexander S. Rodin, Alexander A. Mateiko

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DOI: 10.26583/bit.2026.2.03
Published: 2026-03
Container: Bezopasnost informacionnyh tehnology
Publisher: National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.26583/bit.2026.2.03,
  title = {ANALYTICAL METHOD FOR ASSESSING SOFT ERROR RATES IN DIGITAL ELECTRONICS INDUCED BY GALACTIC COSMIC RAYS},
  author = {Gennady I. Zebrev and Alexander S. Rodin and Alexander A. Mateiko},
  year = {2026},
  journal = {Bezopasnost informacionnyh tehnology},
  doi = {10.26583/bit.2026.2.03},
  url = {https://doi.org/10.26583/bit.2026.2.03}
}

RIS

TY  - JOUR
TI  - ANALYTICAL METHOD FOR ASSESSING SOFT ERROR RATES IN DIGITAL ELECTRONICS INDUCED BY GALACTIC COSMIC RAYS
AU  - Gennady I. Zebrev
AU  - Alexander S. Rodin
AU  - Alexander A. Mateiko
PY  - 2026
JO  - Bezopasnost informacionnyh tehnology
DO  - 10.26583/bit.2026.2.03
UR  - https://doi.org/10.26583/bit.2026.2.03
ER  -

APA

Zebrev, G. I., Rodin, A. S., & Mateiko, A. A. (2026). ANALYTICAL METHOD FOR ASSESSING SOFT ERROR RATES IN DIGITAL ELECTRONICS INDUCED BY GALACTIC COSMIC RAYS. Bezopasnost informacionnyh tehnology. https://doi.org/10.26583/bit.2026.2.03

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crossref · retrieved 2026-11-10T06:48:53.974Z