Statistical analysis of harmonic signals for testing of Electronic Devices

Herasimov S

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DOI: 10.30534/ijeter/2020/143872020
Published: 2020-07-25
Container: International Journal of Emerging Trends in Engineering Research
Publisher: The World Academy of Research in Science and Engineering
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.30534/ijeter/2020/143872020,
  title = {Statistical analysis of harmonic signals for testing of Electronic Devices},
  author = {Herasimov S},
  year = {2020},
  journal = {International Journal of Emerging Trends in Engineering Research},
  doi = {10.30534/ijeter/2020/143872020},
  url = {https://doi.org/10.30534/ijeter/2020/143872020}
}

RIS

TY  - JOUR
TI  - Statistical analysis of harmonic signals for testing of Electronic Devices
AU  - Herasimov S
PY  - 2020
JO  - International Journal of Emerging Trends in Engineering Research
DO  - 10.30534/ijeter/2020/143872020
UR  - https://doi.org/10.30534/ijeter/2020/143872020
ER  -

APA

S, H. (2020). Statistical analysis of harmonic signals for testing of Electronic Devices. International Journal of Emerging Trends in Engineering Research. https://doi.org/10.30534/ijeter/2020/143872020

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crossref · retrieved 2026-09-26T13:29:31.321Z