Design for Testability of Integrated Circuits and Project Protection Difficulties

E. Ph. Pevtsov, T. A. Demenkova, A. A. Shnyakin

Open source

DOI: 10.32362/2500-316x-2019-7-4-60-70
Published: 2019-08-11
Container: Russian Technological Journal
Publisher: RTU MIREA
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.32362/2500-316x-2019-7-4-60-70,
  title = {Design for Testability of Integrated Circuits and Project Protection Difficulties},
  author = {E. Ph. Pevtsov and T. A. Demenkova and A. A. Shnyakin},
  year = {2019},
  journal = {Russian Technological Journal},
  doi = {10.32362/2500-316x-2019-7-4-60-70},
  url = {https://doi.org/10.32362/2500-316x-2019-7-4-60-70}
}

RIS

TY  - JOUR
TI  - Design for Testability of Integrated Circuits and Project Protection Difficulties
AU  - E. Ph. Pevtsov
AU  - T. A. Demenkova
AU  - A. A. Shnyakin
PY  - 2019
JO  - Russian Technological Journal
DO  - 10.32362/2500-316x-2019-7-4-60-70
UR  - https://doi.org/10.32362/2500-316x-2019-7-4-60-70
ER  -

APA

Pevtsov, E. P., Demenkova, T. A., & Shnyakin, A. A. (2019). Design for Testability of Integrated Circuits and Project Protection Difficulties. Russian Technological Journal. https://doi.org/10.32362/2500-316x-2019-7-4-60-70

Source records

crossref · retrieved 2026-09-26T08:46:13.874Z