CBAM-enhanced lightweight CNN for wafer map defect classification

Mst. Rokeya Khatun, Fahmid Al Farid, Sharith Dhar, Md. Saiful Islam, Jia Uddin, Hezerul bin Abdul Karim

Open source

DOI: 10.3389/felec.2026.1750707
Published: 2026-03-12
Container: Frontiers in Electronics
Publisher: Frontiers Media SA
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3389/felec.2026.1750707,
  title = {CBAM-enhanced lightweight CNN for wafer map defect classification},
  author = {Mst. Rokeya Khatun and Fahmid Al Farid and Sharith Dhar and Md. Saiful Islam and Jia Uddin and Hezerul bin Abdul Karim},
  year = {2026},
  journal = {Frontiers in Electronics},
  doi = {10.3389/felec.2026.1750707},
  url = {https://doi.org/10.3389/felec.2026.1750707}
}

RIS

TY  - JOUR
TI  - CBAM-enhanced lightweight CNN for wafer map defect classification
AU  - Mst. Rokeya Khatun
AU  - Fahmid Al Farid
AU  - Sharith Dhar
AU  - Md. Saiful Islam
AU  - Jia Uddin
AU  - Hezerul bin Abdul Karim
PY  - 2026
JO  - Frontiers in Electronics
DO  - 10.3389/felec.2026.1750707
UR  - https://doi.org/10.3389/felec.2026.1750707
ER  -

APA

Khatun, M. R., Farid, F. A., Dhar, S., Islam, M. S., Uddin, J., & Karim, H. B. A. (2026). CBAM-enhanced lightweight CNN for wafer map defect classification. Frontiers in Electronics. https://doi.org/10.3389/felec.2026.1750707

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crossref · retrieved 2026-09-25T03:36:58.247Z