Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning

Mohammad Maruf Billah, Maitiniyazi Maimaitijiang, Swas Kaushal, Bruce Millett, Shahid Nawaz Khan, Jyotirmoy Halder, Jonathan Kleinjan, Sunish K. Sehgal

Open source

DOI
10.3389/fpls.2026.1812052
Published
2026-05-28
Container
Frontiers in Plant Science
Publisher
Frontiers Media SA
Open access
unknown

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BibTeX

@article{allodium:10.3389/fpls.2026.1812052,
  title = {Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning},
  author = {Mohammad Maruf Billah and Maitiniyazi Maimaitijiang and Swas Kaushal and Bruce Millett and Shahid Nawaz Khan and Jyotirmoy Halder and Jonathan Kleinjan and Sunish K. Sehgal},
  year = {2026},
  journal = {Frontiers in Plant Science},
  doi = {10.3389/fpls.2026.1812052},
  url = {https://doi.org/10.3389/fpls.2026.1812052}
}

RIS

TY  - JOUR
TI  - Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning
AU  - Mohammad Maruf Billah
AU  - Maitiniyazi Maimaitijiang
AU  - Swas Kaushal
AU  - Bruce Millett
AU  - Shahid Nawaz Khan
AU  - Jyotirmoy Halder
AU  - Jonathan Kleinjan
AU  - Sunish K. Sehgal
PY  - 2026
JO  - Frontiers in Plant Science
DO  - 10.3389/fpls.2026.1812052
UR  - https://doi.org/10.3389/fpls.2026.1812052
ER  - 

APA

Billah, M. M., Maimaitijiang, M., Kaushal, S., Millett, B., Khan, S. N., Halder, J., Kleinjan, J., & Sehgal, S. K. (2026). Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning. Frontiers in Plant Science. https://doi.org/10.3389/fpls.2026.1812052

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