Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning
- DOI
- 10.3389/fpls.2026.1812052
- Published
- 2026-05-28
- Container
- Frontiers in Plant Science
- Publisher
- Frontiers Media SA
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3389/fpls.2026.1812052,
title = {Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning},
author = {Mohammad Maruf Billah and Maitiniyazi Maimaitijiang and Swas Kaushal and Bruce Millett and Shahid Nawaz Khan and Jyotirmoy Halder and Jonathan Kleinjan and Sunish K. Sehgal},
year = {2026},
journal = {Frontiers in Plant Science},
doi = {10.3389/fpls.2026.1812052},
url = {https://doi.org/10.3389/fpls.2026.1812052}
}RIS
TY - JOUR TI - Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning AU - Mohammad Maruf Billah AU - Maitiniyazi Maimaitijiang AU - Swas Kaushal AU - Bruce Millett AU - Shahid Nawaz Khan AU - Jyotirmoy Halder AU - Jonathan Kleinjan AU - Sunish K. Sehgal PY - 2026 JO - Frontiers in Plant Science DO - 10.3389/fpls.2026.1812052 UR - https://doi.org/10.3389/fpls.2026.1812052 ER -
APA
Billah, M. M., Maimaitijiang, M., Kaushal, S., Millett, B., Khan, S. N., Halder, J., Kleinjan, J., & Sehgal, S. K. (2026). Predicting wheat yield and grain quality with UAV multispectral imagery and deep learning. Frontiers in Plant Science. https://doi.org/10.3389/fpls.2026.1812052
Source records
- crossref · retrieved 2026-09-25T02:00:33.243Z