Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis
- DOI
- 10.3390/agriculture14112014
- Published
- 2024-11-08
- Container
- Agriculture
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/agriculture14112014,
title = {Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis},
author = {Dennis Semyalo and Yena Kim and Emmanuel Omia and Muhammad Akbar Andi Arief and Haeun Kim and Eun-Yeong Sim and Moon S. Kim and Insuck Baek and Byoung-Kwan Cho},
year = {2024},
journal = {Agriculture},
doi = {10.3390/agriculture14112014},
url = {https://doi.org/10.3390/agriculture14112014}
}RIS
TY - JOUR TI - Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis AU - Dennis Semyalo AU - Yena Kim AU - Emmanuel Omia AU - Muhammad Akbar Andi Arief AU - Haeun Kim AU - Eun-Yeong Sim AU - Moon S. Kim AU - Insuck Baek AU - Byoung-Kwan Cho PY - 2024 JO - Agriculture DO - 10.3390/agriculture14112014 UR - https://doi.org/10.3390/agriculture14112014 ER -
APA
Semyalo, D., Kim, Y., Omia, E., Arief, M. A. A., Kim, H., Sim, E., Kim, M. S., Baek, I., & Cho, B. (2024). Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis. Agriculture. https://doi.org/10.3390/agriculture14112014
Source records
- crossref · retrieved 2026-09-27T02:19:48.935Z