Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications

Thomas A. Zirkle, Matthew J. Filmer, Jonathan Chisum, Alexei O. Orlov, Eva Dupont-Ferrier, Joffrey Rivard, Matthew Huebner, Marc Sanquer, Xavier Jehl, Gregory L. Snider

Open source

DOI: 10.3390/app10248797
Published: 2020-12-09
Container: Applied Sciences
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/app10248797,
  title = {Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications},
  author = {Thomas A. Zirkle and Matthew J. Filmer and Jonathan Chisum and Alexei O. Orlov and Eva Dupont-Ferrier and Joffrey Rivard and Matthew Huebner and Marc Sanquer and Xavier Jehl and Gregory L. Snider},
  year = {2020},
  journal = {Applied Sciences},
  doi = {10.3390/app10248797},
  url = {https://doi.org/10.3390/app10248797}
}

RIS

TY  - JOUR
TI  - Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications
AU  - Thomas A. Zirkle
AU  - Matthew J. Filmer
AU  - Jonathan Chisum
AU  - Alexei O. Orlov
AU  - Eva Dupont-Ferrier
AU  - Joffrey Rivard
AU  - Matthew Huebner
AU  - Marc Sanquer
AU  - Xavier Jehl
AU  - Gregory L. Snider
PY  - 2020
JO  - Applied Sciences
DO  - 10.3390/app10248797
UR  - https://doi.org/10.3390/app10248797
ER  -

APA

Zirkle, T. A., Filmer, M. J., Chisum, J., Orlov, A. O., Dupont-Ferrier, E., Rivard, J., Huebner, M., Sanquer, M., Jehl, X., & Snider, G. L. (2020). Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications. Applied Sciences. https://doi.org/10.3390/app10248797

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crossref · retrieved 2026-11-10T07:06:09.950Z