CNN-Based Fault Localization Method Using Memory-Updated Patterns for Integration Test in an HiL Environment

Ki-Yong Choi, Jung-Won Lee

Open source

DOI
10.3390/app9142799
Published
2019-07-12
Container
Applied Sciences
Publisher
MDPI AG
Open access
unknown

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BibTeX

@article{allodium:10.3390/app9142799,
  title = {CNN-Based Fault Localization Method Using Memory-Updated Patterns for Integration Test in an HiL Environment},
  author = {Ki-Yong Choi and Jung-Won Lee},
  year = {2019},
  journal = {Applied Sciences},
  doi = {10.3390/app9142799},
  url = {https://doi.org/10.3390/app9142799}
}

RIS

TY  - JOUR
TI  - CNN-Based Fault Localization Method Using Memory-Updated Patterns for Integration Test in an HiL Environment
AU  - Ki-Yong Choi
AU  - Jung-Won Lee
PY  - 2019
JO  - Applied Sciences
DO  - 10.3390/app9142799
UR  - https://doi.org/10.3390/app9142799
ER  - 

APA

Choi, K., & Lee, J. (2019). CNN-Based Fault Localization Method Using Memory-Updated Patterns for Integration Test in an HiL Environment. Applied Sciences. https://doi.org/10.3390/app9142799

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