Study on the IMC Growth Mechanism of Cu/Sn-58Bi/Cu Joint Under Electromigration with Alternating Current

Bo Wang, Peiying Zhu, Guopei Zhang, Chunyuan Deng, Kaixuan He, Wei Huang, Kailin Pan

Open source

DOI: 10.3390/cryst16020127
Published: 2026-02-09
Container: Crystals
Publisher: MDPI AG
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.3390/cryst16020127,
  title = {Study on the IMC Growth Mechanism of Cu/Sn-58Bi/Cu Joint Under Electromigration with Alternating Current},
  author = {Bo Wang and Peiying Zhu and Guopei Zhang and Chunyuan Deng and Kaixuan He and Wei Huang and Kailin Pan},
  year = {2026},
  journal = {Crystals},
  doi = {10.3390/cryst16020127},
  url = {https://doi.org/10.3390/cryst16020127}
}

RIS

TY  - JOUR
TI  - Study on the IMC Growth Mechanism of Cu/Sn-58Bi/Cu Joint Under Electromigration with Alternating Current
AU  - Bo Wang
AU  - Peiying Zhu
AU  - Guopei Zhang
AU  - Chunyuan Deng
AU  - Kaixuan He
AU  - Wei Huang
AU  - Kailin Pan
PY  - 2026
JO  - Crystals
DO  - 10.3390/cryst16020127
UR  - https://doi.org/10.3390/cryst16020127
ER  -

APA

Wang, B., Zhu, P., Zhang, G., Deng, C., He, K., Huang, W., & Pan, K. (2026). Study on the IMC Growth Mechanism of Cu/Sn-58Bi/Cu Joint Under Electromigration with Alternating Current. Crystals. https://doi.org/10.3390/cryst16020127

Source records

crossref · retrieved 2026-09-25T22:35:19.674Z