A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part III: Approaches Exploiting the Base Current
- DOI
- 10.3390/electronics15173821
- Published
- 2026-08-26
- Container
- Electronics
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/electronics15173821,
title = {A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part III: Approaches Exploiting the Base Current},
author = {Vincenzo d’Alessandro and Ciro Scognamillo and Antonio Pio Catalano},
year = {2026},
journal = {Electronics},
doi = {10.3390/electronics15173821},
url = {https://doi.org/10.3390/electronics15173821}
}RIS
TY - JOUR TI - A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part III: Approaches Exploiting the Base Current AU - Vincenzo d’Alessandro AU - Ciro Scognamillo AU - Antonio Pio Catalano PY - 2026 JO - Electronics DO - 10.3390/electronics15173821 UR - https://doi.org/10.3390/electronics15173821 ER -
APA
d’Alessandro, V., Scognamillo, C., & Catalano, A. P. (2026). A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part III: Approaches Exploiting the Base Current. Electronics. https://doi.org/10.3390/electronics15173821
Source records
- crossref · retrieved 2026-11-10T06:41:36.134Z