Impact of Line Edge Roughness on ReRAM Uniformity and Scaling

Vassilios Constantoudis, George Papavieros, Panagiotis Karakolis, Ali Khiat, Themistoklis Prodromakis, Panagiotis Dimitrakis

Open source

DOI: 10.3390/ma12233972
Published: 2019-11-30
Container: Materials
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/ma12233972,
  title = {Impact of Line Edge Roughness on ReRAM Uniformity and Scaling},
  author = {Vassilios Constantoudis and George Papavieros and Panagiotis Karakolis and Ali Khiat and Themistoklis Prodromakis and Panagiotis Dimitrakis},
  year = {2019},
  journal = {Materials},
  doi = {10.3390/ma12233972},
  url = {https://doi.org/10.3390/ma12233972}
}

RIS

TY  - JOUR
TI  - Impact of Line Edge Roughness on ReRAM Uniformity and Scaling
AU  - Vassilios Constantoudis
AU  - George Papavieros
AU  - Panagiotis Karakolis
AU  - Ali Khiat
AU  - Themistoklis Prodromakis
AU  - Panagiotis Dimitrakis
PY  - 2019
JO  - Materials
DO  - 10.3390/ma12233972
UR  - https://doi.org/10.3390/ma12233972
ER  -

APA

Constantoudis, V., Papavieros, G., Karakolis, P., Khiat, A., Prodromakis, T., & Dimitrakis, P. (2019). Impact of Line Edge Roughness on ReRAM Uniformity and Scaling. Materials. https://doi.org/10.3390/ma12233972

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crossref · retrieved 2026-09-25T12:03:07.169Z