The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature
- DOI
- 10.3390/ma19102047
- Published
- 2026-05-14
- Container
- Materials
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/ma19102047,
title = {The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature},
author = {Xuan Li and Chuang Zhang and Zixi Liu and Jiajie Song and Huidong Tian and Qijia Xie and Zhengmao Zhang and Shengtao Li},
year = {2026},
journal = {Materials},
doi = {10.3390/ma19102047},
url = {https://doi.org/10.3390/ma19102047}
}RIS
TY - JOUR TI - The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature AU - Xuan Li AU - Chuang Zhang AU - Zixi Liu AU - Jiajie Song AU - Huidong Tian AU - Qijia Xie AU - Zhengmao Zhang AU - Shengtao Li PY - 2026 JO - Materials DO - 10.3390/ma19102047 UR - https://doi.org/10.3390/ma19102047 ER -
APA
Li, X., Zhang, C., Liu, Z., Song, J., Tian, H., Xie, Q., Zhang, Z., & Li, S. (2026). The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature. Materials. https://doi.org/10.3390/ma19102047
Source records
- crossref · retrieved 2026-09-27T12:43:50.221Z