Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices.
- DOI
- 10.3390/medsci14050545
- Published
- 2026 Sep 3
- Container
- Medical sciences (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/medsci14050545,
title = {Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices.},
author = {González Rivas M and López-González ÁA and González Carrasco D and Busquets-Cortés C and Vicente-Herrero MT and Ramírez-Manent JI},
year = {2026},
journal = {Medical sciences (Basel, Switzerland)},
doi = {10.3390/medsci14050545},
url = {https://doi.org/10.3390/medsci14050545}
}RIS
TY - JOUR TI - Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices. AU - González Rivas M AU - López-González ÁA AU - González Carrasco D AU - Busquets-Cortés C AU - Vicente-Herrero MT AU - Ramírez-Manent JI PY - 2026 JO - Medical sciences (Basel, Switzerland) DO - 10.3390/medsci14050545 UR - https://doi.org/10.3390/medsci14050545 ER -
APA
M, G. R., ÁA, L., D, G. C., C, B., MT, V., & JI, R. (2026). Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices.. Medical sciences (Basel, Switzerland). https://doi.org/10.3390/medsci14050545
Source records
- pubmed · retrieved 2026-09-25T15:35:01.036Z